Automated Test Handling System

Automated Test Handling System is designed to test the functionality of Integrated Circuit (IC) Chips and Light Emitting Diodes (LED). The test handler will undertake the following sequence of tasks: locate the item (IC Chip or LED) to be tested; generate an electrical connection to the item being tested; and conduct the relevant tests. The high throughput, quality and precision of ATS Group’s automated test handling systems are designed particularly for the electric and electronics industry.